Reply To: Edit_Bins OSVVM
If you are using Intelligent Coverage Randomization, duplicate count bins are ok.
Otherwise, there are simple algorithmic solutions to that problem that do not involve merging.
If you have taken our Advanced VHDL Testbenches and Verification class these are covered in the sections titled Functional Coverage and Advanced Functional Coverage. Also if you have taken the class, contact me privately and I will be happy to setup a web session to walk you through them.
I would be very interested in an example of real world problem that would benefit from having merging and would not be able to use Intelligent Coverage Randomization.